MOSFET n-type (SPICE model)#

block

Block appearance in REPEAT VISION#

 The MOSFET n-type (SPICE model) block is a SPICE model of an n-type MOSFET that implements one version of the model (level 1). The block implements the following equivalent circuit:

Substitution scheme

Substitution scheme#

 Thermal stress is calculated using the formula (1):

(1)#\[VT = \frac{k \cdot T}{q}\]

where:

 \(k\) – Boltzmann constant, \(k=1.38 \cdot 10^{-23}\) [J/K];

 \(T\) - diode temperature, [K];

 \(q\) is the elementary electric charge of an electron, \(q=1.602 \cdot 10^{-19}\) [C].

 Below are the equations for the first-level MOSFET model of direct drain-source voltage polarity.

 When calculating gate capacitances, the equations (2) are used:

(2)#\[\begin{split}Leff=L-2 \cdot DL\\COX=\frac{3.45 \cdot 10^{-14}}{TOX}\\Cox=COX \cdot W \cdot Leff \\ Ldiff=AD/W\\ PS=2 \cdot (W + Ldiff)\\PD=PS\\V_{th}=VTO+GAMMA \cdot (\sqrt{PHI-V_{BS}}-\sqrt{PHI})\end{split}\]

 Shutter capacities are calculated using the formulas:

  • accumulation region (\(V_{gs}\) < \(V_{th}\) – \(PHI\)) (3):

(3)#\[\begin{split}C_{gb}=Cox+CGBO \cdot Leff\\C_{gs}=CGSO \cdot W\\C_{gd}=CGDO \cdot W\end{split}\]
  • depletion region (\(V_{on}\) – \(PHI\) < \(V_{gs}\) < \(V_{th}\)) (4):

(4)#\[\begin{split}C_{gb}=\frac{Cox \cdot (V_{th}-V_{gs})}{PHI}+CGBO \cdot Leff\\C_{gs}=\frac{2}{3} \cdot Cox \cdot (\frac{V_{th}-V_{gs}}{PHI}+1)+CGSO \cdot W\\C_{gd}=CGDO \cdot W\end{split}\]
  • saturation region (\(V_{th}\) < \(V_{gs}\) < \(V_{th}\)+\(V_{ds}\)) (5):`:

(5)#\[\begin{split}C_{gb}=CGBO \cdot Leff\\C_{gs}=\frac{2}{3}\cdot Cox + CGSO \cdot W\\ C_{gd}=CGDO \cdot W\end{split}\]
  • linear region (\(V_{gs}\) > \(V_{th}\)+\(V_{ds}\)) (6):

(6)#\[\begin{split}C_{gb}=CGBO \cdot Leff\\C_{gs}=Cox \cdot (1- \frac{V_{gs}-V_{ds}-V_{th}}{(2\cdot(V_{gs}-V_{th})-V_{ds})^2})+CGDO \cdot W\\C_{gd}=Cox \cdot (1- \frac{V_{gs}-V_{th}}{(2\cdot(V_{gs}-V_{th})-V_{ds})^2})+CGDO \cdot W\end{split}\]

 When calculating the transition regions, the equations are used (7) :

(7)#\[\begin{split}G_{BS}=\frac{dI_{BS}}{dV_{BS}}\\G_{BD}=\frac{dI_{BD}}{dV_{BD}}\\F_{1.VBS} =\begin{cases}\frac{1}{(1-\frac{V_{BS}}{PB})^{MJ}} , & \ V_{BS} \leq FC \cdot PB\\\frac{1-FC \cdot (1 + MJ) + MJ \cdot (\frac{V_{BS}}{PB})}{(1 - FC)^{1+MJ}}, & \ V_{BS}> FC \cdot PB \end{cases}\\F_{2.VBS} =\begin{cases}\frac{1}{(1-\frac{V_{BS}}{PBSW})^{MJSW}} , & \ V_{BS} \leq FC \cdot PBSW\\\frac{1-FC \cdot (1 + MJSW) + MJSW \cdot (\frac{V_{BS}}{PBSW})}{(1 - FC)^{1+MJSW}}, & \ V_{BS}> FC \cdot PBSW \end{cases}\\F_{1.VBD} =\begin{cases}\frac{1}{(1-\frac{V_{BD}}{PB})^{MJ}} , & \ V_{BD} \leq FC \cdot PB\\\frac{1-FC \cdot (1 + MJ) + MJ \cdot (\frac{V_{BD}}{PB})}{(1 - FC)^{1+MJ}}, & \ V_{BD}> FC \cdot PB \end{cases}\\F_{2.VBD} =\begin{cases}\frac{1}{(1-\frac{V_{BD}}{PBSW})^{MJSW}} , & \ V_{BD} \leq FC \cdot PBSW\\\frac{1-FC \cdot (1 + MJSW) + MJSW \cdot (\frac{V_{BD}}{PBSW})}{(1 - FC)^{1+MJSW}}, & \ V_{BD}> FC \cdot PBSW \end{cases}\end{split}\]

 Transition capacitances are calculated using the formulas:

  • with \(CBS\)=0 and \(CBD\)=0 (8):

(8)#\[\begin{split}C_{bs}=CJ \cdot AS \cdot F_{1.VBS} + CJSW \cdot PS \cdot F_{2.VBS} + TT \cdot G_{BS} \\ C_{bd}=CJ \cdot AS \cdot F_{1.VBD} + CJSW \cdot PD \cdot F_{2.VBD} +TT \cdot G_{BD}\end{split}\]
  • for \(CBS\)>0 and \(CBD\)>0 (9):

(9)#\[\begin{split}C_{bs}=CBS \cdot F_{1.VBS} + CJSW \cdot PS \cdot F_{2.VBS} + TT \cdot G_{BS} \\ C_{bd}=CBD \cdot F_{1.VBD} + CJSW \cdot PD \cdot F_{2.VBD} +TT \cdot G_{BD}\end{split}\]

 When calculating the main current of a transistor, the equation is used (10):

(10)#\[K=\frac{KP \cdot W}{L - 2 \cdot LD}\]

 The main current of the transistor is calculated using the formulas:

  • cutoff region {eq}ElectronicSpiceMosfetNMOS11`:

(11)#\[I_d=0\]
  • linear region (12):

(12)#\[I_d=K \cdot (V_{gs} - V_{th} - \frac{V_{ds}}{2}) \cdot V_{ds} \cdot (1 + LAMBDA \cdot V_{ds})\]
  • saturation region (13):

(13)#\[I_d=0.5 \cdot K \cdot (V_{gs} - V_{th})^2 \cdot (1 + LAMBDA \cdot V_{ds})\]

1.  Properties#

Property

Default Value

Description

Units of measurement

L – channel length

1E-4

–

m

W – channel width

1E-4

–

m

AD - area of drain

0.0

–

m\(^2\)

AS – area of source

0.0

–

m\(^2\)

RDS – drain-source shunt resistance

1E6

–

Ohm

RD – drain ohmic resistance

0.0

–

Ohm

RS – source ohmic resistance

0.0

–

Ohm

RG – gate ohmic resistance

0.0

–

Ohm

RB – bulk ohmic resistance

0.0

–

Ohm

CGDO – gate-drain overlap cap.

0.0

–

F/m

CGSO – gate-source overlap cap.

0.0

–

F/m

CGBO – gate-bulk overlap cap.

0.0

–

F/m

CBD – bulk p-n zero-bias B-D cap.

0.0

–

F

CBS – bulk p-n zero-bias B-S cap.

0.0

–

F

CJ – bulk p-n zero-bias bot. cap.

0.0

–

F/m\(^2\)

CJSW – bulk p-n zero-bias s/w cap.

0.0

–

F/m

MJ – bulk p-n zero-bias bottom grad.

0.5

–

–

MJSW – bulk p-n zero-bias s/w coeff.

0.33

–

–

TT – bulk p-n transit time

0.0

–

s

IS – bulk p-n saturation current

1E-14

–

–

PB – bulk p-n bottom potential

0.8

–

V

PBSW – bulk p-n sidewall potential

0.8

–

V

FC – forward-bias depletion coeff.

0.5

–

–

LD – lateral diffusion length

0.0

–

m

KP – process transconductance

2E-5

–

A/V\(^2\)

VTO – zero-bias threshold voltage

0.0

–

V

GAMMA – body-effect coefficient

0.0

–

В\(^{0.5}\)

PHI – surface inversion potential

0.6

–

V

LAMBDA – channel-length modulation

0.0

–

V\(^-1\)

TOX – gate oxide thinkness

1E-7

–

m

T – transistor temperature

300

–

К

2.  Inputs and outputs#

Parameters

Input/Output

Description

Units of measurement

Port type

Drain

Input

-

-

Electronics

Gate

Input

-

-

Electronics

Source

Output

-

-

Electronics

Bulk

Output

-

-

Electronics

In order to see the connection capabilities of the block, you need to go to page Description of block ports